Impact of the Field of a Magnetic Force Microscope Probe on the Skyrmion State in a Modified Co/Pt Film with Perpendicular Anisotropy


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Abstract

We present the results of experiments on the local magnetization reversal of artificial magnetic skyrmions in a Co/Pt multilayer film with a perpendicular magnetization by a magnetic force microscope (MFM) probe. The sample was a Co/Pt film containing an array of cylindrical regions with reduced anisotropy, modified by a focused He+ ion beam. The magnetic state of the sample was monitored by magnetic force microscopy. The magnetization reversal was performed by the MFM probe field during passes over the sample at low altitudes. The effects of the interaction of the field of the MFM probe with the skyrmion state of magnetization in these structures are investigated by micromagnetic simulation.

About the authors

V. L. Mironov

Institute for Physics of Microstructures, Russian Academy of Sciences

Author for correspondence.
Email: mironov@ipmras.ru
Russian Federation, Nizhny Novgorod, 603087

R. V. Gorev

Institute for Physics of Microstructures, Russian Academy of Sciences

Email: mironov@ipmras.ru
Russian Federation, Nizhny Novgorod, 603087

O. L. Ermolaeva

Institute for Physics of Microstructures, Russian Academy of Sciences

Email: mironov@ipmras.ru
Russian Federation, Nizhny Novgorod, 603087

N. S. Gusev

Institute for Physics of Microstructures, Russian Academy of Sciences

Email: mironov@ipmras.ru
Russian Federation, Nizhny Novgorod, 603087

Yu. V. Petrov

St. Petersburg State University

Email: mironov@ipmras.ru
Russian Federation, St. Petersburg, 194034

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