作者的详细信息
Egorov, V. K.
| 期 | 栏目 | 标题 | 文件 |
| 卷 59, 编号 4 (2017) | Phase Transitions | Structural heteroepitaxy during topochemical transformation of silicon to silicon carbide | |
| 卷 61, 编号 12 (2019) | Surface Physics and Thin Films | Ion-Beam and X-Ray Methods of Elemental Diagnostics of Thin Film Coatings |