Author Details
Egorov, E. V.
| Issue | Section | Title | File |
| Vol 59, No 4 (2017) | Phase Transitions | Structural heteroepitaxy during topochemical transformation of silicon to silicon carbide | |
| Vol 61, No 12 (2019) | Surface Physics and Thin Films | Ion-Beam and X-Ray Methods of Elemental Diagnostics of Thin Film Coatings |