Effect of Injection Depletion in p-Si–n-(Si2)1 –x(ZnSe)x (0 ≤ x ≤ 0.01) Heterostructure


Дәйексөз келтіру

Толық мәтін

Ашық рұқсат Ашық рұқсат
Рұқсат жабық Рұқсат берілді
Рұқсат жабық Тек жазылушылар үшін

Аннотация

The current–voltage characteristics of p-Si–n-(Si2)1 –x(ZnSe)x (0 ≤ x ≤ 0.01) heterostructures are studied at various temperatures. It is found that the current–voltage characteristics of such structures contain a portion of a sublinear increase in the current with voltage such as V = V0 exp(Jad). The concentrations of deep impurities responsible for the appearance of the sublinear portion in the current–voltage characteristic are estimated. The experimental results are explained based on the theory of the injection depletion effect.

Авторлар туралы

A. Saidov

Starodubtsev Physical–Technical Institute, Academy of Sciences of Uzbekistan

Хат алмасуға жауапты Автор.
Email: kvant.ph@mail.ru
Өзбекстан, Tashkent, 100084

A. Leyderman

Starodubtsev Physical–Technical Institute, Academy of Sciences of Uzbekistan

Email: kvant.ph@mail.ru
Өзбекстан, Tashkent, 100084

Sh. Usmonov

Starodubtsev Physical–Technical Institute, Academy of Sciences of Uzbekistan

Email: kvant.ph@mail.ru
Өзбекстан, Tashkent, 100084

K. Amonov

Starodubtsev Physical–Technical Institute, Academy of Sciences of Uzbekistan

Email: kvant.ph@mail.ru
Өзбекстан, Tashkent, 100084

Қосымша файлдар

Қосымша файлдар
Әрекет
1. JATS XML

© Pleiades Publishing, Ltd., 2018