Air-Oxidation of Nb Nano-Films


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Resumo

X-ray photoelectron spectroscopy (XPS) depth chemical and phase profiling of air-oxidized niobium nanofilms has been performed. It is found that oxide layer thicknesses depend on the initial thickness of the niobium nanofilm. The increase in thickness of the initial Nb nano-layer is due to increase in thickness of an oxidized layer.

Sobre autores

A. Lubenchenko

National Research University MPEI

Autor responsável pela correspondência
Email: LubenchenkoAV@mpei.ru
Rússia, Moscow, 111250

A. Batrakov

National Research University MPEI

Email: LubenchenkoAV@mpei.ru
Rússia, Moscow, 111250

D. Ivanov

National Research University MPEI

Email: LubenchenkoAV@mpei.ru
Rússia, Moscow, 111250

O. Lubenchenko

National Research University MPEI

Email: LubenchenkoAV@mpei.ru
Rússia, Moscow, 111250

I. Lashkov

National Research University MPEI

Email: LubenchenkoAV@mpei.ru
Rússia, Moscow, 111250

A. Pavolotsky

Chalmers University of Technology

Email: LubenchenkoAV@mpei.ru
Suécia, Goteborg, 41296

B. Schleicher

IFW Dresden, Institute for Metallic Materials

Email: LubenchenkoAV@mpei.ru
Alemanha, Dresden, 01069

N. Albert

IFW Dresden, Institute for Metallic Materials

Email: LubenchenkoAV@mpei.ru
Alemanha, Dresden, 01069

K. Nielsch

IFW Dresden, Institute for Metallic Materials

Email: LubenchenkoAV@mpei.ru
Alemanha, Dresden, 01069

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