Density Control of InP/GaInP Quantum Dots Grown by Metal-Organic Vapor-Phase Epitaxy
- Авторлар: Lebedev D.V.1, Kalyuzhnyy N.A.1, Mintairov S.A.1, Belyaev K.G.1, Rakhlin M.V.1, Toropov A.A.1, Brunkov P.1,2, Vlasov A.S.1, Merz J.3, Rouvimov S.3, Oktyabrsky S.4, Yakimov M.4, Mukhin I.V.5, Shelaev A.V.6, Bykov V.A.6, Romanova A.Y.2, Buryak P.A.2, Mintairov A.M.1,3
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Мекемелер:
- Ioffe Institute
- St. Petersburg Polytechnical University
- University of Notre Dame
- Institute for Materials
- St. Petersburg Academic University
- NT-MDT Spectrum Instruments
- Шығарылым: Том 52, № 4 (2018)
- Беттер: 497-501
- Бөлім: XXV International Symposium “Nanostructures: Physics and Technology”, Saint Petersburg, June 26–30, 2017. Quantum Wells, Quantum Wires, Quantum Dots, and Band Structure
- URL: https://bakhtiniada.ru/1063-7826/article/view/202852
- DOI: https://doi.org/10.1134/S1063782618040206
- ID: 202852
Дәйексөз келтіру
Аннотация
We investigated structural and emission properties of self-organized InP/GaInP quantum dots (QD) grown by metal organic chemical vapor deposition using an amount of deposited In from 7 to 2 monolayers (ML). In the uncapped samples, using atomic force microscopy (AFM), we observed lateral sizes of 100–200 nm, together with a bimodal height distribution having maxima at ∼5 and ∼15 nm, which we denoted as QDs of type A and B, respectively; and reduction of the density of the type-B dots from 4.4 to 1.6 μm–2. The reduction of the density of B-type dots were observed also using transmission electron microscopy of the capped samples. Using single dot low-temperature photoluminescence (PL) spectroscopy we demonstrated effects of Wigner localization for the electrons accumulated in these dots.
Авторлар туралы
D. Lebedev
Ioffe Institute
Хат алмасуға жауапты Автор.
Email: Lebedev.dmitri@mail.ioffe.ru
Ресей, St. Petersburg, 194021
N. Kalyuzhnyy
Ioffe Institute
Email: Lebedev.dmitri@mail.ioffe.ru
Ресей, St. Petersburg, 194021
S. Mintairov
Ioffe Institute
Email: Lebedev.dmitri@mail.ioffe.ru
Ресей, St. Petersburg, 194021
K. Belyaev
Ioffe Institute
Email: Lebedev.dmitri@mail.ioffe.ru
Ресей, St. Petersburg, 194021
M. Rakhlin
Ioffe Institute
Email: Lebedev.dmitri@mail.ioffe.ru
Ресей, St. Petersburg, 194021
A. Toropov
Ioffe Institute
Email: Lebedev.dmitri@mail.ioffe.ru
Ресей, St. Petersburg, 194021
P. Brunkov
Ioffe Institute; St. Petersburg Polytechnical University
Email: Lebedev.dmitri@mail.ioffe.ru
Ресей, St. Petersburg, 194021; St. Petersburg, 195251
A. Vlasov
Ioffe Institute
Email: Lebedev.dmitri@mail.ioffe.ru
Ресей, St. Petersburg, 194021
J. Merz
University of Notre Dame
Email: Lebedev.dmitri@mail.ioffe.ru
АҚШ, Notre Dame, IN, 46556
S. Rouvimov
University of Notre Dame
Email: Lebedev.dmitri@mail.ioffe.ru
АҚШ, Notre Dame, IN, 46556
S. Oktyabrsky
Institute for Materials
Email: Lebedev.dmitri@mail.ioffe.ru
АҚШ, Albany, NY, 12203
M. Yakimov
Institute for Materials
Email: Lebedev.dmitri@mail.ioffe.ru
АҚШ, Albany, NY, 12203
I. Mukhin
St. Petersburg Academic University
Email: Lebedev.dmitri@mail.ioffe.ru
Ресей, St. Petersburg, 194021
A. Shelaev
NT-MDT Spectrum Instruments
Email: Lebedev.dmitri@mail.ioffe.ru
Ресей, Zelenograd, 124460
V. Bykov
NT-MDT Spectrum Instruments
Email: Lebedev.dmitri@mail.ioffe.ru
Ресей, Zelenograd, 124460
A. Romanova
St. Petersburg Polytechnical University
Email: Lebedev.dmitri@mail.ioffe.ru
Ресей, St. Petersburg, 195251
P. Buryak
St. Petersburg Polytechnical University
Email: Lebedev.dmitri@mail.ioffe.ru
Ресей, St. Petersburg, 195251
A. Mintairov
Ioffe Institute; University of Notre Dame
Email: Lebedev.dmitri@mail.ioffe.ru
Ресей, St. Petersburg, 194021; Notre Dame, IN, 46556
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