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On the ohmicity of Schottky contacts


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详细

The conditions under which Schottky contacts become ohmic are analyzed. Proceeding from classical concepts of the mechanisms of current flow, a generalized Schottky contact model is investigated. This model takes into account the thermionic current of majority charge carriers and the recombination current of minority carriers in Schottky contacts with a dielectric gap. Based on an analysis of the predictions of this model, ohmicity criteria are obtained for Schottky contacts and the conditions for a low injection level and the ohmicity of Si-based Schottky contacts are compared. It is shown that the conditions for Schottky-contact ohmicity do not coincide with those for pn junctions.

作者简介

A. Sachenko

Lashkaryov Institute of Semiconductor Physics

编辑信件的主要联系方式.
Email: sach@isp.kiev.ua
乌克兰, Kyiv, 03028

A. Belyaev

Lashkaryov Institute of Semiconductor Physics

Email: sach@isp.kiev.ua
乌克兰, Kyiv, 03028

R. Konakova

Lashkaryov Institute of Semiconductor Physics

Email: sach@isp.kiev.ua
乌克兰, Kyiv, 03028

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