nBn-Photodiode Based on InAsSb/AlAsSb Alloys with a Long-Wavelength Cutoff of 5 μm


Citar

Texto integral

Acesso aberto Acesso aberto
Acesso é fechado Acesso está concedido
Acesso é fechado Somente assinantes

Resumo

The results of studying the photoelectric characteristics of an nBn structure are presented. The photodiodes based on such structures may have a cutoff wavelength as high as 5 μm. Calculations based on these results show that such photodiodes have a threshold photosensitivity comparable with that of traditional analogs. An energy band diagram of the nBn structure is proposed based on experimental results and theoretical estimations; this diagram makes it possible to estimate the effect of potential barriers in the valence band of the wide-gap layer and at its boundaries with narrow-gap layers on the nBn-based photodiode sensitivity. The experimental results of studying the dependence of the photocurrent thermal-activation energy on the photodiode bias turned out to be important for developing the model.

Sobre autores

V. Kulikov

JSC Central Scientific-Research Institute “Cyclone”

Autor responsável pela correspondência
Email: vokul@inbox.ru
Rússia, Moscow, 107497

D. Maslov

JSC Central Scientific-Research Institute “Cyclone”

Email: vokul@inbox.ru
Rússia, Moscow, 107497

A. Sabirov

JSC Central Scientific-Research Institute “Cyclone”

Email: vokul@inbox.ru
Rússia, Moscow, 107497

A. Solodkov

JSC Central Scientific-Research Institute “Cyclone”

Email: vokul@inbox.ru
Rússia, Moscow, 107497

A. Dudin

JSC Svetlana-Rost

Email: vokul@inbox.ru
Rússia, St. Petersburg, 194156

N. Katsavets

JSC Svetlana-Rost

Email: vokul@inbox.ru
Rússia, St. Petersburg, 194156

I. Kogan

JSC Svetlana-Rost

Email: vokul@inbox.ru
Rússia, St. Petersburg, 194156

I. Shukov

JSC Svetlana-Rost

Email: vokul@inbox.ru
Rússia, St. Petersburg, 194156

V. Chaly

JSC Svetlana-Rost

Email: vokul@inbox.ru
Rússia, St. Petersburg, 194156

Arquivos suplementares

Arquivos suplementares
Ação
1. JATS XML

Declaração de direitos autorais © Pleiades Publishing, Ltd., 2018