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Optimization of the Electron Optical System of a Scanning Electron Microscope for Measuring the Size of Micro- and Nanoobjects
Kazmiruk V.V., Kurganov I.G., Podkopaev A.A., Savitskaya T.N.
Monte Carlo Method in Scanning Electron Microscopy. 2. Problems and Solutions
Novikov Y.A.
Depth Profiling Using Reflected Electron Spectroscopy
Afanas’ev V.P., Bodisko Y.N., Gryazev A.S., Kaplya P.S., Fedorovich S.D.
Monte Carlo Method in Scanning Electron Microscopy. 3. Modern Condition of the Problem
Novikov Y.A.
Differential inverse inelastic mean free paths and differential surface excitation probability in aluminium in the energy range of 0.5–120 keV
Afanas’ev V.P., Gryazev A.S., Kaplya P.S., Ridzel O.Y.
Experimental determination of the energy dependence of electron inelastic mean free path in silicon oxide and silicon nitride
Garmash V.I., Djuzhev N.A., Kirilenko E.P., Makhiboroda M.A., Migunov D.M.
Ion energy losses during the charge-exchange process
Belkova Y.A., Novikov N.V., Teplova Y.A.
Modification of the Nanoglobular Structure of Glassy Carbon by Heat Treatment and Ion Irradiation
Andrianova N.N., Borisov A.M., Kazakov V.A., Makunin A.V., Mashkova E.S., Ovchinnikov M.A.
Estimation of the SEM beam diameter by video-signal curves from a trapezoidal structure: 1. Simulation experiment
Larionov Y.V.
Study of the optimum conditions of a vacuum holographic microscope
Egorov N.V., Gileva A.Y., Antonova L.I., Trofimov V.V., Karpov A.G.
Study of multilayer carbon nanotubes subjected to the impact of a nanosecond high-energy ion beam
Bolotov V.V., Knyazev E.V., Sten’kin Y.A., Ivlev K.E.
Two-Flux Model of Charged-Particle Transport in a Condensed Material under Multiple Scattering: Average Energy Losses and Range of a Beam of Monoenergetic Electrons with Energies of 0.1 keV−1.0 MeV
Mikheev N.N.
Features of the crystalline state of graphite layers
Borisowskiy P.A., Moos E.N., Rudenko A.I.
Small-angle approximation and Oswald–Kasper–Gaukler theory of electron reflection from solids
Afanas’ev V.P., Kaplya P.S., Lisitsyna E.D.
Intrinsic excitation effect for the Al and Mg samples XPS analysis
Afanas’ev V.P., Gryazev A.S., Kaplya P.S., Andreyeva Y.O.
Electron Microscopic Study of the Influence of Annealing on Ge–Sb–Te Thin Films Obtained by Vacuum Thermal Evaporation
Sybina Y.S., Borgardt N.I., Lazarenko P.I., Parsegova V.S., Prikhodko A.S., Sherchenkov A.A.
Interaction of Photons with Electrons of a Metal during the Irradiation of Its Surface in Vector-Potential Space
Volobuev A.N., Lukachev S.V., Tolstonogov A.P., Kolomin I.V.
Determination of the Thickness of Nanofilms Using X-Ray Photoelectron Spectroscopy
Kaplya P.S., Efremenko D.S., Afanas’ev V.P.
Studying the formation of a true-secondary-electron signal in the low-voltage SEM mode
Kazmiruk V.V., Kurganov I.G., Osipov N.N., Podkopaev A.A., Savitskaya T.N.
Reflected electron-energy-loss spectra, differential inverse inelastic mean free paths, and angular resolved X-ray photoelectron spectra of a niobium sample
Afanas’ev V.P., Gryazev A.S., Kaplya P.S., Andreyeva Y.O., Golovina O.Y.
Electron Diffraction Analysis of the Structure of Carbon Nanopillars along the Growth Direction
Volkov R.L., Borgardt N.I., Gromov D.G., Dubkov S.V.
Heating of a Thin Crystal Target at the Passage of High-Energy Short Electron Bunches
Babaev A.A., Gogolev A.S.
Investigation of secondary-emission signal formation in the low-voltage SEM mode
Kazmiruk V.V., Kurganov I.G., Osipov N.N., Podkopaev A.A., Savitskaya T.N.
Determination of the Relative Concentration of Deuterium Implanted into Beryllium by Elastic Peak Electron Spectroscopy
Afanas’ev V.P., Gryazev A.S., Kaplya P.S., Köppen M., Rybakova A.V.
Study of the Microstructure, Crystallographic Structure and Thermal Stability of Al–Ti–Nb Alloys Produced by Selective Electron Beam Alloying
Valkov S., Neov D., Bezdushnyi R., Beskrovnyi A., Kozlenko D., Petrov P.
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