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Influence of annealing temperature and its atmosphere on the properties of zinc implanted silicon
Privezentsev V.V., Kulikauskas V.S., Zatekin V.V., Shcherbachev K.D., Tabachkova N.Y., Eidelman K.B., Ksenich S.V., Batrakov A.A.
Features of the Auger spectra of Ti2C, SiC, and WC
Smetyukhova T.N., Druzhinin A.V., Podgorny D.A.
Properties of oxide films on nickel contact surfaces
Bublikov E.I., Kulinich V.I., Shcherbakova E.E.
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