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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
ISSN 1027-4510 (Print) ISSN 1819-7094 (Online)
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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A

Andreyeva, Yu. O.
Andrianov, V. A.
Andrianova, N. N.
Andronikova, D. A.
Andrukhovich, I. M.
Angelov, B.
Anikin, K. A.
Anikin, V. A.
Antipov, A. A.
Antonenko, S. V.
Antonov, A. Yu.
Antonov, D. A.
Antonov, I. N.
Antonova, E. M.
Antonova, L. Kh.
Antonova, N. M.
Anurov, A. E.
Ao, H. H.
Apelfeld, A. V.
Arakelian, S. M.
Arazashvili, L. D.
Aref’ev, A. S.
Arkhipushkin, I. A.
Aronin, A. S.
Artamonov, A. V.

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