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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
ISSN 1027-4510 (Print) ISSN 1819-7094 (Online)
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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N

Novikov, L. S.
Novikov, N. V.
Novikov, V. A.
Novikov, Yu. A.
Novikova, A. A.
Novikova, N. N.
Novodvorsky, O. A.
Novokshonov, A. I.
Novoselova, A. V.
Novoselova, E. G.
Novoselova, M. V.
Nurgaliyev, I. N.
Nuriyev, I. R.
Nuriyeva, A. M.
Nurkin, A.
Nuzhdin, V. I.
Nyamdavaa, E.

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