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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
ISSN 1027-4510 (Print) ISSN 1819-7094 (Online)
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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A B C D E F G H I J K L M N O P Q R S T U V W X Y Z All

S

Surmenev, R. A.
Surmeneva, M. A.
Surnin, D. V.
Surovegina, E. A.
Sutygina, A. N.
Sutygina, Ya. N.
Suvorov, D. V.
Suvorov, E. V.
Svechnikov, M. V.
Svechnikov, N. Yu.
Svinarev, F. B.
Svintsov, A. A.
Svotina, V. V.
Sybina, Yu. S.
Sycheva, A. A.
Sypchenko, V. S.
Syromyatnikov, V. G.
Syrov, Y. V.
Syrov, Yu. V.
Syrtanov, M. S.
Syshchenko, V. V.
Sysoev, I. A.
Syugaev, A. V.

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