Estimate of Errors in the Determination of Parameters of Linear Thermal Circuits of Semiconductor Devices Based on the Frequency Dependence of the Thermal Impedance

详细

We propose a method for determining the parameters of linear thermal circuits of semiconductor devices represented in the form of series-connected RC circuits. As a result of computer modeling, we obtain an estimate for errors in determining the indicated parameters based on the frequency dependence of the modulus of the thermal impedance.