Email this article Estimate of Errors in the Determination of Parameters of Linear Thermal Circuits of Semiconductor Devices Based on the Frequency Dependence of the Thermal Impedance
- Authors: Sergeev V.A.1, Frolov I.V.1
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Affiliations:
- Ulyanovskii Branch, Kotelnikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences
- Issue: Vol 59, No 8 (2016)
- Pages: 850-855
- Section: Thermal Measurements
- URL: https://bakhtiniada.ru/0543-1972/article/view/245461
- DOI: https://doi.org/10.1007/s11018-016-1056-4
- ID: 245461
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Abstract
We propose a method for determining the parameters of linear thermal circuits of semiconductor devices represented in the form of series-connected RC circuits. As a result of computer modeling, we obtain an estimate for errors in determining the indicated parameters based on the frequency dependence of the modulus of the thermal impedance.
About the authors
V. A. Sergeev
Ulyanovskii Branch, Kotelnikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences
Author for correspondence.
Email: ufire@mv.ru
Russian Federation, Ulyanovsk
I. V. Frolov
Ulyanovskii Branch, Kotelnikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences
Email: ufire@mv.ru
Russian Federation, Ulyanovsk
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