Measurement of the Reflectivity of Radiation Absorbent Materials by Pulsed Spectroscopy
- Авторлар: Turkin V.A.1, Sakharov K.Y.1, Mikheev O.V.1, Sukhov A.V.1, Aleshko A.I.1
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Мекемелер:
- All-Russia Research Institute of Optophysical Measurements (VNIIOFI)
- Шығарылым: Том 60, № 12 (2018)
- Беттер: 1252-1255
- Бөлім: Article
- URL: https://bakhtiniada.ru/0543-1972/article/view/246369
- DOI: https://doi.org/10.1007/s11018-018-1349-x
- ID: 246369
Дәйексөз келтіру
Аннотация
Results from an experimental study of the reflectivity of radiation adsorbent materials probed by ultrashort electromagnetic radiation are presented. Ultra wide-band pulsed microwave spectroscopic methods are used. Measurements of reflectivity by traditional narrow band and ultra-wide band techniques are compared.
Авторлар туралы
V. Turkin
All-Russia Research Institute of Optophysical Measurements (VNIIOFI)
Email: sukhov@vniiofi.ru
Ресей, Moscow
K. Sakharov
All-Russia Research Institute of Optophysical Measurements (VNIIOFI)
Email: sukhov@vniiofi.ru
Ресей, Moscow
O. Mikheev
All-Russia Research Institute of Optophysical Measurements (VNIIOFI)
Email: sukhov@vniiofi.ru
Ресей, Moscow
A. Sukhov
All-Russia Research Institute of Optophysical Measurements (VNIIOFI)
Хат алмасуға жауапты Автор.
Email: sukhov@vniiofi.ru
Ресей, Moscow
A. Aleshko
All-Russia Research Institute of Optophysical Measurements (VNIIOFI)
Email: sukhov@vniiofi.ru
Ресей, Moscow
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