Measurement of the Reflectivity of Radiation Absorbent Materials by Pulsed Spectroscopy
- Authors: Turkin V.A.1, Sakharov K.Y.1, Mikheev O.V.1, Sukhov A.V.1, Aleshko A.I.1
-
Affiliations:
- All-Russia Research Institute of Optophysical Measurements (VNIIOFI)
- Issue: Vol 60, No 12 (2018)
- Pages: 1252-1255
- Section: Article
- URL: https://bakhtiniada.ru/0543-1972/article/view/246369
- DOI: https://doi.org/10.1007/s11018-018-1349-x
- ID: 246369
Cite item
Abstract
Results from an experimental study of the reflectivity of radiation adsorbent materials probed by ultrashort electromagnetic radiation are presented. Ultra wide-band pulsed microwave spectroscopic methods are used. Measurements of reflectivity by traditional narrow band and ultra-wide band techniques are compared.
About the authors
V. A. Turkin
All-Russia Research Institute of Optophysical Measurements (VNIIOFI)
Email: sukhov@vniiofi.ru
Russian Federation, Moscow
K. Yu. Sakharov
All-Russia Research Institute of Optophysical Measurements (VNIIOFI)
Email: sukhov@vniiofi.ru
Russian Federation, Moscow
O. V. Mikheev
All-Russia Research Institute of Optophysical Measurements (VNIIOFI)
Email: sukhov@vniiofi.ru
Russian Federation, Moscow
A. V. Sukhov
All-Russia Research Institute of Optophysical Measurements (VNIIOFI)
Author for correspondence.
Email: sukhov@vniiofi.ru
Russian Federation, Moscow
A. I. Aleshko
All-Russia Research Institute of Optophysical Measurements (VNIIOFI)
Email: sukhov@vniiofi.ru
Russian Federation, Moscow
Supplementary files
