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Synthesis specifics of Mg(Fe0.8Ga0.2)2O4 films on GaN


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Abstract

Mg(Fe0.8Ga0.2)2O4 films 340 nm thick were prepared by ion-beam sputtering on aluminasmoothed GaN substrates. Reactions that can occur between the components of heterostructure during its crystallization in the range 298.15–1273 K are analyzed. In order for Mg(Fe0.8Ga0.2)2O4 films to be continuous, their crystallization temperature should be lowered and alumina deposition—sputtering on GaN should be repeated several times.

About the authors

O. N. Kondrat’eva

Kurnakov Institute of General and Inorganic Chemistry

Email: ketsko@igic.ras.ru
Russian Federation, Leninskii pr. 31, Moscow, 119991

A. I. Stognii

Research and Engineering Center for Materials Science

Email: ketsko@igic.ras.ru
Belarus, Minsk

N. N. Novitskii

Research and Engineering Center for Materials Science

Email: ketsko@igic.ras.ru
Belarus, Minsk

A. V. Bespalov

Moscow Technological University (MGTU MIREA)

Email: ketsko@igic.ras.ru
Russian Federation, Moscow

O. L. Golikova

Moscow Technological University (MGTU MIREA)

Email: ketsko@igic.ras.ru
Russian Federation, Moscow

G. E. Nikiforova

Kurnakov Institute of General and Inorganic Chemistry

Email: ketsko@igic.ras.ru
Russian Federation, Leninskii pr. 31, Moscow, 119991

M. N. Smirnova

Kurnakov Institute of General and Inorganic Chemistry

Email: ketsko@igic.ras.ru
Russian Federation, Leninskii pr. 31, Moscow, 119991

V. A. Ketsko

Kurnakov Institute of General and Inorganic Chemistry

Author for correspondence.
Email: ketsko@igic.ras.ru
Russian Federation, Leninskii pr. 31, Moscow, 119991

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