X-Ray Diffraction Studies of Metallic Palladium-Based Foil Filters Using Synchrotron Radiation


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Abstract

This paper presents the results of the study of the long-term relaxation states of metallic palladium-based foil filters (Pd, 9.6 at %; Y and Pd, 5.3 at %; In, 0.5 at %; Ru) after hydrogenation (82 000 and 58 500 h, respectively) using X-ray diffraction and synchrotron radiation (SR). We analyzed the normalized integral intensities of diffraction maxima for two orders of reflections from coherent scattering regions (CSRs) along crystallographic directions [111] and [100].

About the authors

O. V. Akimova

Faculty of Physics, Moscow State University

Author for correspondence.
Email: akimova@physics.msu.ru
Russian Federation, Moscow, 119991

A. A. Veligzhanin

Russian Research Center “Kurchatov Institute”

Email: akimova@physics.msu.ru
Russian Federation, Moscow, 123182

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