Interaction of an Electromagnetic H Wave with a Thin Metal Film on a Dielectric Substrate in the Case of an Anisotropic Fermi Metal Surface


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The interaction of an electromagnetic H wave with a thin metal film has been calculated with allowance for the ellipsoidal Fermi surface and constancy of the electron mean free path for different angles of incidence of the electromagnetic wave θ and different coefficients of specular reflection q1 and q2 at reflection of electrons from the film surfaces. The metal film is between two media with permittivities ε1 and ε2. The dependences of reflectance R, transmission T, and absorption A on the effective mass of conduction electrons have been analyzed.

Sobre autores

I. Kuznetsova

Demidov Yaroslavl State University

Email: romanov.yar357@mail.ru
Rússia, Yaroslavl, 150003

D. Romanov

Demidov Yaroslavl State University

Autor responsável pela correspondência
Email: romanov.yar357@mail.ru
Rússia, Yaroslavl, 150003

A. Yushkanov

Moscow Oblast State University

Email: romanov.yar357@mail.ru
Rússia, Moscow, 105005

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