Interaction of an Electromagnetic H Wave with a Thin Metal Film on a Dielectric Substrate in the Case of an Anisotropic Fermi Metal Surface
- Авторлар: Kuznetsova I.A.1, Romanov D.N.1, Yushkanov A.A.2
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Мекемелер:
- Demidov Yaroslavl State University
- Moscow Oblast State University
- Шығарылым: Том 127, № 2 (2019)
- Беттер: 328-334
- Бөлім: Optics of Surfaces and Interfaces
- URL: https://bakhtiniada.ru/0030-400X/article/view/166071
- DOI: https://doi.org/10.1134/S0030400X19080174
- ID: 166071
Дәйексөз келтіру
Аннотация
The interaction of an electromagnetic H wave with a thin metal film has been calculated with allowance for the ellipsoidal Fermi surface and constancy of the electron mean free path for different angles of incidence of the electromagnetic wave θ and different coefficients of specular reflection q1 and q2 at reflection of electrons from the film surfaces. The metal film is between two media with permittivities ε1 and ε2. The dependences of reflectance R, transmission T, and absorption A on the effective mass of conduction electrons have been analyzed.
Авторлар туралы
I. Kuznetsova
Demidov Yaroslavl State University
Email: romanov.yar357@mail.ru
Ресей, Yaroslavl, 150003
D. Romanov
Demidov Yaroslavl State University
Хат алмасуға жауапты Автор.
Email: romanov.yar357@mail.ru
Ресей, Yaroslavl, 150003
A. Yushkanov
Moscow Oblast State University
Email: romanov.yar357@mail.ru
Ресей, Moscow, 105005
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