The Use of Spectral Ellipsometry and Raman Spectroscopy in Screening Diagnostics of Colorectal Cancer


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Abstract

Diagnostic pilot monitoring of the groups of healthy patients and patients with colorectal cancer (CRC) at different stages of the disease was carried out using Raman spectroscopy (RS) and measuring the state of polarized light near the conditions of observation of surface plasmon resonance (SPR). The reaction of the blood serum antigens with antibodies to serum M2 pyruvate kinase (M2-PK) nears the conditions of observation of SPR was used for diagnosing; for this, the Ellipse-SPEC spectral ellipsometric complex created at the Rzhanov Institute of Semiconductor Physics (Siberian Branch, Russian Academy of Sciences) and having a high sensitivity, accuracy, and nondestructive nature of the effect on the studied sample, was used in the work. The peak intensities at 1005, 1157, and 1520 cm–1 in Raman spectra in CRC patients as compared with healthy individuals (as well as the intensity of surface plasmon resonance) were significantly lower, correlating with the stage of the disease and the presence of metastases; this allows to consider these optical methods for studying the blood serum as promising diagnostic approaches in diagnosis CRC, including in the early stages of the disease.

About the authors

V. N. Kruchinin

Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences

Author for correspondence.
Email: vladd.kruch@yandex.ru
Russian Federation, Novosibirsk, 630090

M. V. Kruchinina

Research Institute of Internal and Preventive Medicine,
Branch of the Federal Research Center Institute of Cytology and Genetics, Siberian Branch,
Russian Academy of Sciences; Novosibirsk State Medical University

Email: vladd.kruch@yandex.ru
Russian Federation, Novosibirsk, 630089; Novosibirsk, 630091

Ya. I. Prudnikova

Research Institute of Internal and Preventive Medicine,
Branch of the Federal Research Center Institute of Cytology and Genetics, Siberian Branch,
Russian Academy of Sciences

Email: vladd.kruch@yandex.ru
Russian Federation, Novosibirsk, 630089

E. V. Spesivtsev

Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences

Email: vladd.kruch@yandex.ru
Russian Federation, Novosibirsk, 630090

S. V. Rykhlitskii

Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences

Email: vladd.kruch@yandex.ru
Russian Federation, Novosibirsk, 630090

V. A. Volodin

Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences; Novosibirsk State University

Email: vladd.kruch@yandex.ru
Russian Federation, Novosibirsk, 630090; Novosibirsk, 630090

S. V. Shekhovtsov

Institute of Cytology and Genetics, Siberian Branch, Russian Academy of Sciences

Email: vladd.kruch@yandex.ru
Russian Federation, Novosibirsk, 630090

S. E. Pel’tek

Institute of Cytology and Genetics, Siberian Branch, Russian Academy of Sciences

Email: vladd.kruch@yandex.ru
Russian Federation, Novosibirsk, 630090

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