Photoabsorption by the electron subsystem of a semiconductor nanoparticle


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Abstract

The IR photoabsorption cross section of a semiconductor nanoparticle has been calculated. Light is absorbed by conduction electrons and trapped electrons in the volume and surface of the nanoparticle. Electron concentrations have been obtained by minimizing the total free energy of charges in the system. The photoabsorption cross section has two characteristic maxima corresponding to the absorption by conduction electrons and by trapped electrons in the nanoparticle volume. The number of trapped electrons on the surface is relatively small, so that they do not contribute to the total cross section.

About the authors

V. A. Astapenko

Moscow Institute of Physics and Technology

Email: s2001@list.ru
Russian Federation, Dolgoprudnyi, Moscow oblast, 141700

S. V. Sakhno

Moscow Institute of Physics and Technology

Author for correspondence.
Email: s2001@list.ru
Russian Federation, Dolgoprudnyi, Moscow oblast, 141700

M. A. Kozhushner

Semenov Institute of Chemical Physics

Email: s2001@list.ru
Russian Federation, Moscow, 119991

V. S. Posvyanskii

Semenov Institute of Chemical Physics

Email: s2001@list.ru
Russian Federation, Moscow, 119991

L. I. Trakhtenberg

Moscow Institute of Physics and Technology; Semenov Institute of Chemical Physics; State Scientific Center

Email: s2001@list.ru
Russian Federation, Dolgoprudnyi, Moscow oblast, 141700; Moscow, 119991; Moscow, 105064

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