High quality ZnS/Au/ZnS transparent conductive tri-layer films deposited by pulsed laser deposition
- Авторы: Wang C.1,2, Li Q.1,3, Wang J.1, Zhang L.3, Zhao F.3, Dong F.3
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Учреждения:
- College of Physics and Engineering
- Aeronautical Engineering College
- School of Physics and Optoelectronic Engineering
- Выпуск: Том 121, № 1 (2016)
- Страницы: 68-71
- Раздел: Condensed-Matter Spectroscopy
- URL: https://bakhtiniada.ru/0030-400X/article/view/164903
- DOI: https://doi.org/10.1134/S0030400X16070080
- ID: 164903
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Аннотация
ZnS/Au/ZnS tri-layer films were deposited on quartz glass substrates by pulsed laser deposition. The influence of Au layer thickness on optical and electrical properties of the tri-layer ZnS/Au/ZnS was studied. X-ray diffractometer (XRD) and scanning electron microscope were employed to characterize the crystalline structure and surface morphology of the tri-layer films. Hall measurements, ultraviolet and visible spectrophotometer, four-point probe were used to explore the optoelectronic properties of the ZnS/Au/ZnS. The increase of Au layer thickness resulted in the decreased resistivity, the increased carrier concentration, and the declined transmittance in the visible light region.
Об авторах
Caifeng Wang
College of Physics and Engineering; Aeronautical Engineering College
Автор, ответственный за переписку.
Email: cfwang_2004@163.com
Китай, Qufu, 273165; Binzhou, 256603
Qingshan Li
College of Physics and Engineering; School of Physics and Optoelectronic Engineering
Email: cfwang_2004@163.com
Китай, Qufu, 273165; Yantai, 264025
Jisuo Wang
College of Physics and Engineering
Email: cfwang_2004@163.com
Китай, Qufu, 273165
Lichun Zhang
School of Physics and Optoelectronic Engineering
Email: cfwang_2004@163.com
Китай, Yantai, 264025
Fengzhou Zhao
School of Physics and Optoelectronic Engineering
Email: cfwang_2004@163.com
Китай, Yantai, 264025
Fangying Dong
School of Physics and Optoelectronic Engineering
Email: cfwang_2004@163.com
Китай, Yantai, 264025
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