Improvement and Extension of the Capabilities of a Manipulator Based on the Probe of an Atomic-Force Microscope Operating in the Hybrid Mode

Abstract

A system for detecting the clamping point of a manipulator tip based on the probe of an atomic-force microscope operating in the hybrid mode was upgraded. The upgrading of the detection system made it possible not only to obtain topographic images of surfaces in this mode with vertical noises smaller than 10 nm, but also to use this manipulator to move microdroplets over the surface of a substrate. A method was proposed and implemented for moving nanowires using a fluid flow created by the tip of an atomic-force microscope.