A mobile microcell for measuring the electrical characteristics of individual nanowires and nanotubes
- Authors: Volkov R.L.1, Borgardt N.I.1, Gurtovoi V.L.2,3, Il’in A.I.1, Karabulin A.V.4, Matyushenko V.I.5, Khodos I.I.2, Gordon E.B.6
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Affiliations:
- MIET National Research University of Electronic Technology
- Institute of Problems of Microelectronic Technology and Ultra-High-Purity Materials
- Moscow Institute of Physics and Technology (State University)
- MEPhI National Research Nuclear University
- Talroze Institute of Energy Problems of Chemical Physics, Chernogolovka Branch
- Institute of Problems of Chemical Physics
- Issue: Vol 59, No 6 (2016)
- Pages: 848-856
- Section: Laboratory Techniques
- URL: https://bakhtiniada.ru/0020-4412/article/view/159402
- DOI: https://doi.org/10.1134/S0020441216060105
- ID: 159402
Cite item
Abstract
A mobile measuring cell was proposed and created using a focused ion beam as a nanoknife for measuring the electrical characteristics of individual nanowires and nanotubes by the four-wire method. The cell consists of two elements: the basic one, on whose surface a nanoconductor is deposited, and the auxiliary element that provides the electrical connection of the primary element to the wires of the external measuring circuit. Micro- and nanoscale wires in both elements of the cell were formed from gold films deposited on a silicon oxide surface. This provides reliable contacts between a nanoobject and the wires. In this paper, the application of the proposed method was demonstrated using examples of a multiwalled carbon nanotube and a thin platinum nanowire. The electrical resistance of the nanotube was measured using the two-wire method, whereas the current–voltage characteristic for the platinum nanowire was measured via the fourwire method.
About the authors
R. L. Volkov
MIET National Research University of Electronic Technology
Email: Gordon@ficp.ac.ru
Russian Federation, pl. Shokina 1, Zelenograd, Moscow, 124498
N. I. Borgardt
MIET National Research University of Electronic Technology
Email: Gordon@ficp.ac.ru
Russian Federation, pl. Shokina 1, Zelenograd, Moscow, 124498
V. L. Gurtovoi
Institute of Problems of Microelectronic Technology and Ultra-High-Purity Materials; Moscow Institute of Physics and Technology (State University)
Email: Gordon@ficp.ac.ru
Russian Federation, ul. Akademika Osip’yana 6, Chernogolovka, Moscow oblast, 142432; Institutskii per. 9, Dolgoprudnyi, Moscow oblast, 141700
A. I. Il’in
MIET National Research University of Electronic Technology
Email: Gordon@ficp.ac.ru
Russian Federation, pl. Shokina 1, Zelenograd, Moscow, 124498
A. V. Karabulin
MEPhI National Research Nuclear University
Email: Gordon@ficp.ac.ru
Russian Federation, Kashirskoe sh. 31, Moscow, 115409
V. I. Matyushenko
Talroze Institute of Energy Problems of Chemical Physics, Chernogolovka Branch
Email: Gordon@ficp.ac.ru
Russian Federation, pr. Akademika Semenova 1/10, Chernogolovka, Moscow oblast, 142432
I. I. Khodos
Institute of Problems of Microelectronic Technology and Ultra-High-Purity Materials
Email: Gordon@ficp.ac.ru
Russian Federation, ul. Akademika Osip’yana 6, Chernogolovka, Moscow oblast, 142432
E. B. Gordon
Institute of Problems of Chemical Physics
Author for correspondence.
Email: Gordon@ficp.ac.ru
Russian Federation, pr. Akademika Semenova 1, Chernogolovka, Moscow oblast, 142432
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