Remote Imaging by Nanosecond Terahertz Spectrometer with Standoff Detector


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Resumo

Creation and application of the remote imaging spectrometer based on high power nanosecond terahertz source with standoff detector is reported. 2D transmission images of metal objects hided in nonconductive (dielectric) materials were recorded. Reflection images of metal objects mounted on silicon wafers are recorded with simultaneous determination of the wafer parameters (thickness/material).

Sobre autores

J.-G. Huang

Shanghai Institute of Technical Physics of the Chinese Academy of Sciences

Autor responsável pela correspondência
Email: jghuang@mail.sitp.ac.cn
República Popular da China, Shanghai

Z.-M. Huang

Shanghai Institute of Technical Physics of the Chinese Academy of Sciences

Email: jghuang@mail.sitp.ac.cn
República Popular da China, Shanghai

Yu. Andreev

Institute of Monitoring of Climatic and Ecological Systems of the Siberian Branch of the Russian Academy of Sciences; National Research Tomsk State University

Email: jghuang@mail.sitp.ac.cn
Rússia, Tomsk; Tomsk

K. Kokh

V. S. Sobolev Institute of Geology and Mineralogy of the Siberian Branch of the Russian Academy of Sciences; Institute of High Current Electronics of the Siberian Branch of the Russian Academy of Sciences

Email: jghuang@mail.sitp.ac.cn
Rússia, Novosibirsk; Tomsk

G. Lanskii

Institute of Monitoring of Climatic and Ecological Systems of the Siberian Branch of the Russian Academy of Sciences; National Research Tomsk State University

Email: jghuang@mail.sitp.ac.cn
Rússia, Tomsk; Tomsk

A. Potekaev

National Research Tomsk State University; V. D. Kuznetsov Siberian Physical-Technical Institute at Tomsk State University

Email: jghuang@mail.sitp.ac.cn
Rússia, Tomsk; Tomsk

V. Svetlichnyi

National Research Tomsk State University; Institute of High Current Electronics of the Siberian Branch of the Russian Academy of Sciences

Email: jghuang@mail.sitp.ac.cn
Rússia, Tomsk; Tomsk

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