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Quality Control of ZnGeP2 Single Crystals Using Optical Methods


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Resumo

A method for detection of subsurface defects in ZnGeP2crystals is proposed. Evaluation of this method is performed and experimental results are presented.

Sobre autores

V. Dyomin

National Research Tomsk State University

Email: kamenev87@mail.ru
Rússia, Tomsk

I. Polovtsev

National Research Tomsk State University

Email: kamenev87@mail.ru
Rússia, Tomsk

D. Kamenev

National Research Tomsk State University

Autor responsável pela correspondência
Email: kamenev87@mail.ru
Rússia, Tomsk

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