Structural Modification of Graphene on Copper Substrates Irradiated by Nanosecond High-Intensity Ion Beams


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Аннотация

Interaction of a nanosecond high-intensity pulsed ion beam with thin graphene films on copper substrates is analyzed. Methods of Raman spectroscopy are used to investigate the degree of graphene degradation depending on the integral implanted dose. The role of the substrate in the structural degradation of graphene irradiated by charged particle beams is demonstrated using the software package SRIM, intended for modeling radiative defect cascades under irradiation by charged particle beams, and the data on radiation resistance of graphene available in the literature.

Авторлар туралы

O. Poddubskaya

Research Institute for Nuclear Problems of Belarusian State University

Хат алмасуға жауапты Автор.
Email: paddubskaya@gmail.com
Белоруссия, Minsk

P. Kuzhir

Research Institute for Nuclear Problems of Belarusian State University; National Research Tomsk Polytechnic University

Email: paddubskaya@gmail.com
Белоруссия, Minsk; Tomsk

А. Stepanov

National Research Tomsk Polytechnic University

Email: paddubskaya@gmail.com
Ресей, Tomsk

A. Martynenko

National Research Tomsk Polytechnic University

Email: paddubskaya@gmail.com
Ресей, Tomsk

G. Remnev

National Research Tomsk Polytechnic University

Email: paddubskaya@gmail.com
Ресей, Tomsk

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