Email this article Phase Transformations in the Film-Substrate System Irradiated with e-beam
- Authors: Ivanov Y.F.1,2, Klopotov A.A.2,3, Potekaev A.I.2,4, Laskovnev A.P.5, Teresov A.D.1,2, Tsvetkov N.A.3, Petrikova E.A.1,2, Krysina O.V.1,2, Ivanova O.V.3, Shugurov V.V.1, Shegidevich A.A.5, Kulagina V.V.6,4
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Affiliations:
- High Current Electronics Institute of the Siberian Branch of the Russian Academy of Sciences
- National Research Tomsk State University
- Tomsk State Architecture and Building University
- V. D. Kuznetsov Siberian Physical-Technical Institute at Tomsk State University
- Physical Technical Institute of the National Academy of Sciences
- Siberian State Medical University
- Issue: Vol 60, No 1 (2017)
- Pages: 175-180
- Section: Article
- URL: https://bakhtiniada.ru/1064-8887/article/view/237907
- DOI: https://doi.org/10.1007/s11182-017-1057-z
- ID: 237907
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Abstract
It is reported that irradiation of the film/substrate system (Zr–Ti–Cu)/(A7) with a high-intensity electron beam is followed by the formation of a multi-phase state, whose microhardness is approximately by a factor of 4.5 higher than that of the technical grade aluminum А7, which is due to the substrate structure grain refinement and precipitation of zirconium aluminides in the surface layer.
About the authors
Yu. F. Ivanov
High Current Electronics Institute of the Siberian Branch of the Russian Academy of Sciences; National Research Tomsk State University
Author for correspondence.
Email: yufi55@mail.ru
Russian Federation, Tomsk; Tomsk
A. A. Klopotov
National Research Tomsk State University; Tomsk State Architecture and Building University
Email: yufi55@mail.ru
Russian Federation, Tomsk; Tomsk
A. I. Potekaev
National Research Tomsk State University; V. D. Kuznetsov Siberian Physical-Technical Institute at Tomsk State University
Email: yufi55@mail.ru
Russian Federation, Tomsk; Tomsk
A. P. Laskovnev
Physical Technical Institute of the National Academy of Sciences
Email: yufi55@mail.ru
Belarus, Minsk
A. D. Teresov
High Current Electronics Institute of the Siberian Branch of the Russian Academy of Sciences; National Research Tomsk State University
Email: yufi55@mail.ru
Russian Federation, Tomsk; Tomsk
N. A. Tsvetkov
Tomsk State Architecture and Building University
Email: yufi55@mail.ru
Russian Federation, Tomsk
E. A. Petrikova
High Current Electronics Institute of the Siberian Branch of the Russian Academy of Sciences; National Research Tomsk State University
Email: yufi55@mail.ru
Russian Federation, Tomsk; Tomsk
O. V. Krysina
High Current Electronics Institute of the Siberian Branch of the Russian Academy of Sciences; National Research Tomsk State University
Email: yufi55@mail.ru
Russian Federation, Tomsk; Tomsk
O. V. Ivanova
Tomsk State Architecture and Building University
Email: yufi55@mail.ru
Russian Federation, Tomsk
V. V. Shugurov
High Current Electronics Institute of the Siberian Branch of the Russian Academy of Sciences
Email: yufi55@mail.ru
Russian Federation, Tomsk
A. A. Shegidevich
Physical Technical Institute of the National Academy of Sciences
Email: yufi55@mail.ru
Belarus, Minsk
V. V. Kulagina
Siberian State Medical University; V. D. Kuznetsov Siberian Physical-Technical Institute at Tomsk State University
Email: yufi55@mail.ru
Russian Federation, Tomsk; Tomsk
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