Through Concentration Profiling of Heterojunction Solar Cells
- 作者: Yakovlev G.E.1, Nyapshaev I.A.2,3, Shakhrai I.S.2, Andronikov D.A.2, Zubkov V.I.1, Terukov E.I.1,2,3
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隶属关系:
- St. Petersburg State Electrotechnical University LETI
- R&D Center for Thin Film Technologies in Energetics
- Ioffe Physical Technical Institute, Russian Academy of Sciences
- 期: 卷 45, 编号 9 (2019)
- 页面: 890-893
- 栏目: Article
- URL: https://bakhtiniada.ru/1063-7850/article/view/208420
- DOI: https://doi.org/10.1134/S106378501909013X
- ID: 208420
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详细
Electrochemical capacitance–voltage profiling has been used to examine heterojunction solar cells based on single-crystal silicon. Specific features of the electrochemical capacitance–voltage profiling of modern multilayer heterojunction solar cells have been analyzed. The distribution profiles of majority carriers across the whole thickness of the samples were obtained, including, for the first time, those in layers of conducting indium tin oxide.
作者简介
G. Yakovlev
St. Petersburg State Electrotechnical University LETI
编辑信件的主要联系方式.
Email: geyakovlev@etu.ru
俄罗斯联邦, St. Petersburg, 197376
I. Nyapshaev
R&D Center for Thin Film Technologies in Energetics; Ioffe Physical Technical Institute, Russian Academy of Sciences
Email: geyakovlev@etu.ru
俄罗斯联邦, St. Petersburg, 194021; St. Petersburg, 194021
I. Shakhrai
R&D Center for Thin Film Technologies in Energetics
Email: geyakovlev@etu.ru
俄罗斯联邦, St. Petersburg, 194021
D. Andronikov
R&D Center for Thin Film Technologies in Energetics
Email: geyakovlev@etu.ru
俄罗斯联邦, St. Petersburg, 194021
V. Zubkov
St. Petersburg State Electrotechnical University LETI
Email: geyakovlev@etu.ru
俄罗斯联邦, St. Petersburg, 197376
E. Terukov
St. Petersburg State Electrotechnical University LETI; R&D Center for Thin Film Technologies in Energetics; Ioffe Physical Technical Institute, Russian Academy of Sciences
Email: geyakovlev@etu.ru
俄罗斯联邦, St. Petersburg, 197376; St. Petersburg, 194021; St. Petersburg, 194021
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