The Structure, Dielectric, and Optical Properties of c-Oriented SBN-50 Films Grown on Pt/Al2O3 Substrate

Resumo

Studies of the structure, dielectric and optical properties of thin films of a relaxor ferroelectric Ba_0.5Sr_0.5Nb₂O₆ grown on Pt(111)/Al₂O₃ (c-cut) substrate by high-frequency RF-sputtering in oxygen atmosphere, were performed. X-ray diffraction studies showed that Ba_0.5Sr_0.5Nb₂O₆ films are c-oriented. The unit cell parameters in the tetragonal approximation were c = 3.949(1) Å and a = 12.38(1) Å. It was established that the ferroelectric–paraelectric phase-transition temperature rises and optical anisotropy increases in the object in comparison with the bulk material. Reasons for the elucidated regularities are discussed.