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IR and THz Bolometric Detectors with Absorbers Characterized by Frequency Dispersion of Conductivity


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Abstract

Application of thin metal absorbers allows one to significantly increase the absorption coefficient and sensitivity of matrix THz microbolometric detectors. It is shown that absorbers characterized by frequency dispersion of conductivity, in contrast to conventional nondispersive absorbers, can provide almost total IR absorption retaining high sensitivity in the THz range.

About the authors

M. A. Dem’yanenko

Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences

Author for correspondence.
Email: demyanenko@isp.nsc.ru
Russian Federation, Novosibirsk, 630090

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