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Investigation into the Influence of a Buffer Layer of Nanoporous Silicon on the Atomic and Electronic Structure and Optical Properties of AIIIN/por-Si Heterostructures Grown by Plasma-Activated Molecular-Beam Epitaxy


Дәйексөз келтіру

Толық мәтін

Ашық рұқсат Ашық рұқсат
Рұқсат жабық Рұқсат берілді
Рұқсат жабық Тек жазылушылар үшін

Аннотация

The influence of using a buffer sublayer of nanoporous por-Si on the morphological, physical, and structural properties of nanocolumnar InxGa1 –xN structures fabricated by plasma-activated molecular-beam epitaxy on single-crystal Si(111) substrates is shown. Using a set of structural-spectroscopic analytical methods, the electronic structure of the grown heterostructures, morphology, and optical properties are investigated, and the interrelations between them are established. It is shown that the use of a por-Si sublayer makes it possible to attain a more uniform distribution of diameters of InxGa1 –xN nanocolumns and to increase the photoluminescence intensity of the latter.

Авторлар туралы

P. Seredin

Voronezh State University; Ural Federal University

Хат алмасуға жауапты Автор.
Email: paul@phys.vsu.ru
Ресей, Voronezh, 394006; Yekaterinburg, 620002

A. Lenshin

Voronezh State University

Email: paul@phys.vsu.ru
Ресей, Voronezh, 394006

D. Zolotukhin

Voronezh State University

Email: paul@phys.vsu.ru
Ресей, Voronezh, 394006

D. Goloshchapov

Voronezh State University

Email: paul@phys.vsu.ru
Ресей, Voronezh, 394006

A. Mizerov

St. Petersburg National Research Academic University, Russian Academy of Sciences

Email: paul@phys.vsu.ru
Ресей, St. Petersburg, 194021

I. Arsentyev

Ioffe Institute

Email: paul@phys.vsu.ru
Ресей, St. Petersburg, 194021

A. Beltyukov

Udmurt Federal Research Center, Ural Branch, Russian Academy of Sciences

Email: paul@phys.vsu.ru
Ресей, Izhevsk, 426000

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