Author Details
Ratnikov, V. V.
| Issue | Section | Title | File |
| Vol 52, No 2 (2018) | Microcrystalline, Nanocrystalline, Porous, and Composite Semiconductors | Change in the Character of Biaxial Stresses with an Increase in x from 0 to 0.7 in AlxGa1 – xN:Si Layers Obtained by Ammonia Molecular Beam Epitaxy | |
| Vol 52, No 6 (2018) | Fabrication, Treatment, and Testing of Materials and Structures | Effect of the Sapphire-Nitridation Level and Nucleation-Layer Enrichment with Aluminum on the Structural Properties of AlN Layers |