Author Details
Presnyakov, R. V.
| Issue | Section | Title | File |
| Vol 52, No 2 (2018) | Fabrication, Treatment, and Testing of Materials and Structures | Electrical Activity of Extended Defects in Multicrystalline Silicon | |
| Vol 53, No 1 (2019) | Microcrystalline, Nanocrystalline, Porous, and Composite Semiconductors | Dependence of the Bulk Electrical Properties of Multisilicon on the Grain Misorientation Parameters |