Author Details
Voelskow, M.
| Issue | Section | Title | File |
| Vol 51, No 9 (2017) | Fabrication, Treatment, and Testing of Materials and Structures | Specific features of the ion-beam synthesis of Ge nanocrystals in SiO2 thin films | |
| Vol 53, No 8 (2019) | Nonelectronic Properties of Semiconductors (Atomic Structure, Diffusion) | Diffusion and Interaction of In and As Implanted into SiO2 Films |