| Edição |
Seção |
Título |
Arquivo |
| Volume 50, Nº 7 (2016) |
Physics of Semiconductor Devices |
Electrochemical lithiation of silicon with varied crystallographic orientation |
|
| Volume 51, Nº 5 (2017) |
Physics of Semiconductor Devices |
Formation of a p-type emitter with the involvement of surfactants in GaAs photoelectric converters |
|
| Volume 52, Nº 1 (2018) |
Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena |
Mobility of the Two-Dimensional Electron Gas in DA-pHEMT Heterostructures with Various δ–n-Layer Profile Widths |
|
| Volume 52, Nº 2 (2018) |
Microcrystalline, Nanocrystalline, Porous, and Composite Semiconductors |
Change in the Character of Biaxial Stresses with an Increase in x from 0 to 0.7 in AlxGa1 – xN:Si Layers Obtained by Ammonia Molecular Beam Epitaxy |
|
| Volume 53, Nº 11 (2019) |
Surfaces, Interfaces, and Thin Films |
Investigation of Composition Uniformity in Thickness of GaInAsP Layers Grown on InP Substrates by Vapor-Phase Epitaxy |
|
