Structural and Optical Properties of (110) Plane Textured SnO2:Zn Thin Films

Аннотация

SnO₂:xZn thin films (x = 0, 1, 3, 5, 10, 15 wt%) were deposited onto a glass substrate by ultrasonic spray pyrolysis at 350°C and characterized by XRD, UV–VIS spectra, AFM imaging, and texture analysis. All deposited thin films exhibited preferential orientation along the (110) plane. The films were highly transparent (about 80%) in the visible. Upon an increase in x, the band gap energy of the films decreased from 3.7 eV to 3.3 eV.