Crystal dislocation in SEM with image processing

Abstract

Image processing algorithm is implemented to detect the grain boundary of the crystal using (SEM) Scanning Electron Microscopy. This paper presents a method for edge-detection in color image based on Sobel, Canny operator’s algorithm and discrete wavelet transform. The performance of these methods is effective and faster. Filtering is another approach to clear the noise of an image. Scanning Electron Microscopy (SEM) used to inspect semiconductor materials and devices for several decades, continues to increase in importance. Removal of noise is an important step in the image restoration process, but de-noising of the image has remained a challenging problem in recent research associated with image process. De-noising is used to remove the noise from corrupted images, while retaining the edges and other detailed features too are an essential part of de-noising.