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Vol 12, No 1 (2018)
Analysis of the Three-Dimensional Model of Diffusion of Minority Charge Carriers Generated by an Electron Probe in a Heterogeneous Semiconductor Material by Means of Projection Methods
Seregina E.V., Stepovich M.A., Makarenkov A.M.
PDF
(Eng)
Vol 11, No 6 (2017)
Investigation of the Structure and Functional Properties of Diamond-Like Coatings Obtained by Physical Vapor Deposition
Vysotina E.A., Kazakov V.A., Polyansky M.N., Savushkina S.V., Sivtsov K.I., Sigalaev S.K., Lyakhovetsky M.A., Mironova S.A., Zilova O.S.
PDF
(Eng)
Vol 11, No 5 (2017)
On the possibility of using the Galerkin projection method to model the spatial distribution of minority charge carriers generated by an electron probe in a semiconductor
Seregina E.V., Stepovich M.A., Makarenkov A.M., Filippov M.N.
PDF
(Eng)
Vol 11, No 4 (2017)
Study of hafnium-oxide coatings by means of nuclear backscattering spectrometry
Borisov A.M., Polyanskiy M.N., Savushkina S.V., Laptev I.N., Dankova T.E., Tkachenko N.V., Vostrikov V.G., Kamenskih A.I.
PDF
(Eng)
Vol 11, No 2 (2017)
Development and study of a conceptual model of an X-ray source with a field emission cathode
Djuzhev N.A., Makhiboroda M.A., Preobrazhensky R.Y., Demin G.D., Gusev E.E., Dedkova A.A.
PDF
(Eng)
Vol 10, No 6 (2016)
Features of the surface morphology of CaF2/Si(100) films obtained by solid-phase epitaxy
Ilyushin V.A., Velichko A.A., Krupin A.Y., Gavrilenko V.A., Savinov A.N., Katzuba A.V.
PDF
(Eng)
Vol 10, No 5 (2016)
Differential inverse inelastic mean free path determination on the base of X-ray photoelectron emission spectra
Afanas’ev V.P., Gryazev A.S., Efremenko D.S., Kaplya P.S., Lyapunov N.V.
PDF
(Eng)
Vol 10, No 3 (2016)
Determining the potential based on Rutherford backscattering data and electron screening in nuclear fusion reactions
Zinoviev A.N., Meluzova D.S.
PDF
(Eng)
Vol 13, No 6 (2019)
Atomic Structure Probing of Thin Metal Films via Vacuum Holographic Microscopy
Egorov N.V., Antonova L.I., Trofimov V.V., Gileva A.Y.
PDF
(Eng)
Vol 13, No 2 (2019)
Modeling of the Influence of the Thickness of an Insulating Film on a Cathode Surface on its Effective Secondary-Electron Emission Yield in Low-Current Gas Discharge
Kristya V.I., Ha M.T., Fisher M.R.
PDF
(Eng)
Vol 12, No 5 (2018)
Modification of Zinc-Implanted Silicon by Swift Xenon Ion Irradiation
Privezentsev V.V., Skuratov V.A., Kulikauskas V.S., Makunin A.V., Ksenich S.V., Steinman E.A., Tereshchenko A.N., Goryachev A.V.
PDF
(Eng)
Vol 12, No 3 (2018)
Influence of High Energy Impact on the Structural-Phase State and Tribological Properties of the Surface Layer of Metal-Ceramic Composite Materials
Ivanov K.V., Ivanov Y.F., Mohovikov A.A., Ovcharenko V.E.
PDF
(Eng)
Vol 12, No 1 (2018)
Depth Distribution of Residual Fluorine in a Polyvinylidene Fluoride Film under Electron Bombardment
Zhivulin V.E., Pesin L.A., Zherebtsov D.A., Sidelnikova A.L.
PDF
(Eng)
Vol 11, No 6 (2017)
Nitriding of Stainless Steel in Electron-Beam Plasma in the Pulsed and DC Generation Modes
Gavrilov N.V., Mamaev A.S., Chukin A.V.
PDF
(Eng)
Vol 11, No 5 (2017)
Short-Range order of TlIn1–xSnxTe2 thin films
Alekperov E.S.
PDF
(Eng)
Vol 11, No 4 (2017)
Space‒time inhomogeneity of the electron flow in pyroelectric X-ray sources
Andrianov V.A., Bush A.A., Erzinkyan A.L., Kamentsev K.E.
PDF
(Eng)
Vol 11, No 1 (2017)
Using electron backscatter diffraction to investigate the influence of mechanical polishing on the state of the surface of diamond
Korostylev E.V., Bormashov V.S., Tarelkin S.A., Doronin M.A.
PDF
(Eng)
Vol 10, No 5 (2016)
Fabrication of nitrogen-containing coatings in reed switches by pulsed ion-plasma treatment
Zeltser I.A., Gurov V.S., Rybin N.B., Tolstogouzov A., Fu D.J., Kumar P.
PDF
(Eng)
Vol 10, No 5 (2016)
Backscattered electron imaging of micro- and nanostructures: 5. SEM signal formation model
Novikov Y.A.
PDF
(Eng)
Vol 10, No 3 (2016)
Cathodoluminescence studies of exciton diffusion in gallium nitride
Polyakov A.N., Stepovich M.A., Turtin D.V.
PDF
(Eng)
Vol 10, No 2 (2016)
On the structural features of influenza A nucleoprotein particles from small-angle X-ray scattering data
Egorov V.V., Shaldzhyan A.A., Gorshkov A.N., Zabrodskaya Y.A., Lebedev D.V., Kuklin A.I., Ksenofontova O.I., Shvetsov A.V., Vasin A.V., Tsybalova L.M., Isaev-Ivanov V.V.
PDF
(Eng)
Vol 13, No 6 (2019)
Electron-Microscopy Studies of Microstructural Features of the Pore Space in Polymictic Sandstones
Kuzmin V.A., Skibitskaya N.A.
PDF
(Eng)
Vol 13, No 5 (2019)
Determination of the Thickness of Thin Films Based on Scanning Electron Microscopy and Energy Dispersive X-Ray Analysis
Sokolov S.A., Milovanov R.A., Sidorov L.N.
PDF
(Eng)
Vol 13, No 4 (2019)
Effect of the Surface of Medical Titanium Endoprostheses on the Efficiency of Fibrointegration
Shaikhaliyev A.I., Polisan A.A., Ivanov S.Y., Parkhomenko Y.N., Malinkovich M.D., Yarygin K.N., Arazashvili L.D.
PDF
(Eng)
Vol 13, No 2 (2019)
On the Dynamic Annealing of Ion-Induced Radiation Damage in Diamond under Irradiation at Elevated Temperatures
Borisov A.M., Kazakov V.A., Mashkova E.S., Ovchinnikov M.A., Pitirimova E.A.
PDF
(Eng)
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