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On the Precision Preparation of Samples for Atom Probe Tomography Using a Focused Ion Beam in a SEM
Khoroshilov V.V., Korchuganova O.A., Lukyanchuk A.A., Raznitsyn O.A., Aleev A.A., Rogozhkin S.V.
Estimation of the diameter of a SEM beam by video-signal curves from a trapezoidal Structure: 2. Experiment
Larionov Y.V.
High-resolution X-ray diffractometry and transmission electron microscopy as applied to the structural study of InAlAs/InGaAs/InAlAs multilayer transistor nanoheterostructures
Galiev G.B., Klimov E.A., Imamov R.M., Ganin G.V., Pushkarev S.S., Maltsev P.P., Zhigalina O.M., Orekhov A.S., Vasil’ev A.L., Presniakov M.Y., Trunkin I.N.
Estimation of the SEM beam diameter by video-signal curves from a trapezoidal structure: 1. Simulation experiment
Larionov Y.V.
Electron Microscopic Study of the Influence of Annealing on Ge–Sb–Te Thin Films Obtained by Vacuum Thermal Evaporation
Sybina Y.S., Borgardt N.I., Lazarenko P.I., Parsegova V.S., Prikhodko A.S., Sherchenkov A.A.
Analysis of the Structure and Composition of Fe2O3 Oxides Subjected to Magnetic Pulse Treatment
Virus A.A., Shipko M.N., Stepovich M.A., Kaminskaya T.P., Korovushkin V.V., Tikhonov A.I., Savchenko E.S.
Microstructural Effects in Electron-Microscopic Studies of Carbonate Rocks
Kuzmin V.A.
Test Object for SEM Calibration. 1. Methods for Quality Control of Manufacturing
Novikov Y.A.
Fabrication of nitrogen-containing coatings in reed switches by pulsed ion-plasma treatment
Zeltser I.A., Gurov V.S., Rybin N.B., Tolstogouzov A., Fu D.J., Kumar P.
Investigation of the heat resistance of zirconia coatings generated by microarc oxidation
Savushkina S.V., Polyansky M.N., Borisov A.M., Vinogradov A.V., Lyudin V.B., Dankova T.E., Agureev L.E.
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