A Device for Mechanical Testing of Elements of Micro- and Nanosystems


如何引用文章

全文:

开放存取 开放存取
受限制的访问 ##reader.subscriptionAccessGranted##
受限制的访问 订阅存取

详细

For the mechanical testing of elements of micro- and nanosystems, we propose a device based on an electrodynamic actuator, which creates regulated forces within the range 10–3–1 N. The minimum recorded change in the geometry of a specimen under the load is equal to 0.3 μm. The actuator can be used for tensile, bending, compression, and fatigue tests of the specimens. By using the actuator, we can find the mechanical characteristics of thin films, wires, and microbeams whose length varies from several micrometers to several millimeters. The accessibility of the actuator and its zero stiffness simplify the procedure of measurements.

作者简介

А. Postnikov

Yaroslavl Branch, Institute of Physics and Technology, Russian Academy of Sciences

编辑信件的主要联系方式.
Email: mems@yf-ftian.ru
俄罗斯联邦, Yaroslavl

补充文件

附件文件
动作
1. JATS XML

版权所有 © Springer Science+Business Media, LLC, part of Springer Nature, 2018