Measurement of Structural Parameters Based on X-Ray Emission Spectra with Energy-Dispersive Detection


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The feasibility of using the diffraction peaks in x-ray emission spectra detected with energy dispersion for measuring the spacing between lattice planes in crystalline substances is demonstrated.

作者简介

V. Gavrilenko

Research Center for the Study of the Properties of Surfaces and Vacuum (NITsPV)

编辑信件的主要联系方式.
Email: fgupnicpv@mail.ru
俄罗斯联邦, Moscow

A. Zablotskii

Research Center for the Study of the Properties of Surfaces and Vacuum (NITsPV); Moscow Institute of Physics and Technology (MFTI)

Email: fgupnicpv@mail.ru
俄罗斯联邦, Moscow; Dolgoprudnyi, Moscow Region

S. Korneichuk

Systems for Microscopy and Analysis

Email: fgupnicpv@mail.ru
俄罗斯联邦, Moscow

A. Kuzin

Research Center for the Study of the Properties of Surfaces and Vacuum (NITsPV)

Email: fgupnicpv@mail.ru
俄罗斯联邦, Moscow

T. Kupriyanova

Institute of General and Inorganic Chemistry, Russian Academy of Sciences (IONKh RAN)

Email: fgupnicpv@mail.ru
俄罗斯联邦, Moscow

O. Lyamina

Institute of General and Inorganic Chemistry, Russian Academy of Sciences (IONKh RAN)

Email: fgupnicpv@mail.ru
俄罗斯联邦, Moscow

P. Todua

Research Center for the Study of the Properties of Surfaces and Vacuum (NITsPV); Moscow Institute of Physics and Technology (MFTI)

Email: fgupnicpv@mail.ru
俄罗斯联邦, Moscow; Dolgoprudnyi, Moscow Region

M. Filippov

Research Center for the Study of the Properties of Surfaces and Vacuum (NITsPV); Institute of General and Inorganic Chemistry, Russian Academy of Sciences (IONKh RAN)

Email: fgupnicpv@mail.ru
俄罗斯联邦, Moscow; Moscow

V. Shklover

Systems for Microscopy and Analysis

Email: fgupnicpv@mail.ru
俄罗斯联邦, Moscow

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