The Creation of the Center of Metrological Assurance of Nanotechnologies and Assessment of the Compliance of the Products of the Nano Industry

A. S. Gusev; Yu. M. Zolotarevskii; V. L. Lyaskovskii

doi:10.1007/s11018-016-0871-y

The Creation of the Center of Metrological Assurance of Nanotechnologies and Assessment of the Compliance of the Products of the Nano Industry

作者: Gusev A.S.¹, Zolotarevskii Y.M.¹, Lyaskovskii V.L.¹
隶属关系:
1. All-Russia Research Institute of Optophysical Measurements (VNIIOFI)
期: 卷 58, 编号 11 (2016)
页面: 1210-1213
栏目: Article
URL: https://bakhtiniada.ru/0543-1972/article/view/245550
DOI: https://doi.org/10.1007/s11018-016-0871-y
ID: 245550

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详细

Preconditions for the creation and process of development of the Center of Metrological Assurance and Assessment of Compliance of Nanotechnologies and the output of the nano industry are considered. The organizational structure of the Center as well as the structure and function of its regional and branch divisions are described.