Microprocessor-Based System for Measuring the Modulus and Components of the Complex Resistance of a Two-Terminal Element in a Multiterminal Electrical Circuit

Resumo

We propose a microprocessor-based measurement system (MBMS) for measuring the modulus and components of the complex resistance of an individual two-terminal element and the complex resistance of a two-terminal element in a branch of a multiterminal electrical circuit (MTEC) of T type or H type with one and with two points that are inaccessible for connection of the complex resistance of the two-terminal element (CRTTE). We present the block diagram for the microprocessor-based measurement system and results of the study.