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Measurement Techniques
ISSN 0543-1972 (Print) ISSN 1573-8906 (Online)
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Keywords accelerometer calibration comparator concentration diagnostics frequency instability laser laser beam laser radiation magnetic field mathematical model metrological characteristics nondestructive testing photodetector primary standard sensitivity sensor spectrum standard uncertainty verification
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Keywords accelerometer calibration comparator concentration diagnostics frequency instability laser laser beam laser radiation magnetic field mathematical model metrological characteristics nondestructive testing photodetector primary standard sensitivity sensor spectrum standard uncertainty verification
Home > Search > Author Details

Author Details

Zolotarevskii, Yu. M.

Issue Section Title File
Vol 58, No 11 (2016) On the Jubilee of Vniiofi Improvement of the Standards Base for Optophysical Measurements
Vol 58, No 11 (2016) Article Metrological Support of Measurements of the Frequency of Radiation in Optical Data Processing Systems
Vol 58, No 11 (2016) Article The Creation of the Center of Metrological Assurance of Nanotechnologies and Assessment of the Compliance of the Products of the Nano Industry
Vol 58, No 11 (2016) Article Creation of Calibrated Samples of a Measure with Relief Elements Less Than 100 nm
Vol 58, No 11 (2016) Article Spectroradiometry of Ultraviolet Radiation
Vol 61, No 8 (2018) Article State Primary Standard GET 156-2015 of Units of Spectral Coefficients of Directional Transmission, Diffuse and Specular Reflections in the Wavelength Range from 0.2 to 20.0 μm
Vol 61, No 9 (2018) State Standards Improving the State Base of Measurement Standards in the Field of Photonics
Vol 61, No 9 (2018) Article Operation and Development of a Center for Collective Use in the Field of Photonics
Vol 61, No 11 (2019) Article Spectrophotometric Instruments Incorporated into get 156–2015, the State Primary Standard of the Unit of Spectral Regular Transmittance, Unit of Spectral Diffuse Reflectance, and Unit of Spectral Specular Reflectance in the Range of Wavelengths from 0.2 to 20.0 μm
 

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