THEORY OF SYSTEMS WITH SMALL BOUNDARY ROUGHNESS IN APPLICATION TO ELECTRON STATES IN QUANTUM CHANNELS, ELECTRO- AND HYDRODYNAMICS

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Sobre autores

L. Braginsky

Rahanov Institute of Semiconductor Physics, Siberian Branch of the Russian Academy of Sciences; Novosibirsk State University

Autor responsável pela correspondência
Email: jetp@kapitza.ras.ru
Novosibirsk, Russia

M. Entin

Rahanov Institute of Semiconductor Physics, Siberian Branch of the Russian Academy of Sciences

Email: jetp@kapitza.ras.ru
Novosibirsk, Russia

Bibliografia

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  3. R. E. Prange and T. W. Nee, Quantum Spectroscopy of the Low-Field Oscillations in the Surface Impedance, Phys. Rev. 168, 779 (1968).
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  5. L. S. Braginskii and I. A. Gilinskii, Dokl. Akad. Nauk SSSR 293, 1097 (1987) [Sov. Phys. Dokl. 32, 297 (1987)].
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  7. P. I. Arseev, Perturbation Theory for the Green's Function of an Electromagnetic Field on a Rough Surface, Zh. Eksp. Teor. Fiz. 93, 464 (1987) [JETP 65, 262 (1987)].
  8. R. Z. Vitlina and A. M. Dykhne, Reflection of Electromagnetic Waves from a Surface with a Low Relief, Zh. Eksp. Teor. Fiz. 99, 1758 (1991) [JETP 72, 983 (1991)].
  9. G. V. Rozhnov, Zh. Eksp. Teor. Fiz. 94, 50 (1988) [Sov. Phys. JETP 67, 240 (1988)].
  10. Y. C. Huang, C. Williams, and H. Smith, Direct Comparison of Cross-Sectional Scanning Capacitance Microscope Dopant Profile and Vertical Secondary Ion-Mass Spectroscopy Profile, J. Vacuum Sci. Technol. B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena 14, 433 (1996).
  11. R. C. Barrett and C. F. Quate, Charge Storage in a Nitride-Oxide-Silicon Medium by Scanning Capacitance Microscopy, J. Appl. Phys. 70 2725 (1991).
  12. N. C. Bruce, A. Garcia-Valenzuela, and D. Kouznetsov, Rough-Surface Capacitor: Approximations of the Capacitance with Elementary Functions, J. Phys. D: Appl. Phys. 32, 2692 (1999).
  13. D. R. Steinhauer, C. P. Vlahacos, S. K. Dutta, F. C. Wellstood, and S. M. Anlage, Surface Resistance Imaging with a Scanning Near-Field Microwave Microscope, Appl. Phys. Lett. 71, 1736 (1997).
  14. C. P. Vlahacos, R. C. Black, S. M. Anlage, A. Amar, and F. C. Wellstood, Nearfield Scanning Microwave Microscope with 100 μm Resolution, Appl. Phys. Lett. 69, 3272 (1996).
  15. Yu Luo, J. B. Pendry, and A. Aubry, Surface Plasmons and Singularities, Nano Lett. 10, 4186 (2010); Yu Luo, A. Aubry, and J. B. Pendry, Electromagnetic Contribution to Surface-Enhanced Raman Scattering from Rough Metal Surfaces: A Transformation Optics Approach, Phys. Rev. B 83, 155422 (2011).
  16. Zeev Nehari, Conformal Mapping, Dover Publications, New York (1982).
  17. https://en.wikipedia.org/wiki/Schwarz-Christoffelmapping

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