Peculiarities in the Formation of X-Ray Fluxes by Waveguide–Resonators of Different Construction
- 作者: Egorov V.K.1, Egorov E.V.1,2
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隶属关系:
- Institute of Microelectronics Technology and High-Purity Materials
- RUDN University
- 期: 卷 124, 编号 6 (2018)
- 页面: 838-849
- 栏目: Physical Optics
- URL: https://bakhtiniada.ru/0030-400X/article/view/165725
- DOI: https://doi.org/10.1134/S0030400X1806005X
- ID: 165725
如何引用文章
详细
The phenomenon of total external reflection (TER) of quasi-monochromatic X-ray radiation fluxes on a material interface and the effect of waveguide–resonator propagation of these fluxes in nanosize extended slit clearance, as well as a device operating on the basis of this effect—a planar X-ray waveguide–resonator—are briefly described. Experimental data on the formation of an X-ray flux by a composite X-ray waveguide–resonator are presented, and a model describing the decrease in the angular divergence of the formed flux without a decrease in the integral intensity is proposed. The model is based on the conception of partial angular tunneling of the radiation flux in the gap between two consequently mounted and mutually adjusted waveguide–resonators; the tunneling is implemented due to the interaction between interference fields of standing X-ray waves excited by the radiation transported by the slit clearance of these waveguide–resonators.
作者简介
V. Egorov
Institute of Microelectronics Technology and High-Purity Materials
编辑信件的主要联系方式.
Email: egorov@iptm.ru
俄罗斯联邦, Chernogolovka, Moscow oblast, 142432
E. Egorov
Institute of Microelectronics Technology and High-Purity Materials; RUDN University
Email: egorov@iptm.ru
俄罗斯联邦, Chernogolovka, Moscow oblast, 142432; Moscow, 117198
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