作者的详细信息

Shvets, V. A.

期	栏目	标题	文件
卷 121, 编号 3 (2016)	Physical Optics	Analytical solution of the direct problem of ellipsometry for some profiles of optical constants of inhomogeneous layers
卷 123, 编号 2 (2017)	Physical Optics	A method for measuring the phase of the reflection coefficient in the visible range of the spectrum
卷 123, 编号 5 (2017)	Condensed-Matter Spectroscopy	Dispersion of the refractive index in high-k dielectrics
卷 127, 编号 2 (2019)	Nanophotonics	Determining the Compositional Profile of HgTe/Cd_xHg_1 – _xTe Quantum Wells by Single-Wavelength Ellipsometry